Electrical Diagnostics
- Standard machine diagnostics (machine current and voltage into vacuum chamber)
- Standard load B-dots (current into load region)
- Inductive voltage monitor (voltage into load region)
- Micro-B-dots (small field sensors for localized current measurements)
Optical Diagnostics
- Four-frame pulsed laser imaging system (170 ps pulsed laser, 5 ns inter-pulse delay) at 1064, 532, 355, and 266 nm
- Interferometry
- Shadowgraphy
- Schlieren
- Angular filter refractometry
- Avalanche photodiode (APD) and other diode detectors (time-resolved self-emission, filterable)
- Two single-frame Andor iStar ICCDs, with minimum exposure time 2-3 ns
- Four-frame ICCD camera
- Specialized Imaging Model SIMX4
- Exposure time: 3 ns – 10 ms in 1 ns steps
- Inter-frame time: 0 ns – 20 ms in 1 ns steps
- Eight-frame ICCD camera
- Cordin Model 222
- Exposure time: 2.5 ns – 10 ms
- Inter-frame time: 0 ns – 10 ms in 250 ps steps
- Twelve-frame ultra-high speed framing camera
- Invisible Vision UHSi 12/24
- Exposure time: 5 ns – 1 ms in 5 ns steps
- Inter-frame time: 0 ns – 10 ms in 5 ns steps
- Requires coordination with University of New Mexico, ECE department
- Questar QM100 Long-Distance Microscope assemblies for imaging of ~1 um phenomena
- Streaked Visible Spectroscopy (SVS)
- Photonic Doppler Velocimetry (PDV), 2-channel
- Second-Harmonic Orthogonally Polarized Dispersion Interferometer (SHOP-DI) […]
- Gated visible spectroscopy (1D spatial distribution)
- Gated vacuum ultraviolet (VUV) spectroscopy (1D spatial distribution)
X-Ray Diagnostics
- Filtered PIN diodes
- Support for image plate
- Ultra-fast x-ray imager (UXI) (in commissioning phase)
Questions about our diagnostic capabilities? Please contact:
